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Title: Variation of Optical Constants of RF Sputtered a- Si Thin Films With Deposition Conditions
Authors: Tashtush، Nihad M.
Subject: Thin films - Optical properties;Optical constants;Refractive index-Measurement - Technique;Thin films - Simulation methods;Sputtering (Physics)
Issue Date: 2002
Publisher: عمادة البحث العلمي والدراسات العليا - جامعة اليرموك
Description: أبحاث اليرموك : سلسلة العلوم الأساسية و الهندسية
2002, Vol. 11, Issue 2B, p861-876
Includes References , Includes Abstract in English and Arabic Language
Document Type: Article
Language: ENG
Appears in Collections:Abhath Al-Yarmouk Basic Science & Engineering - AYBSE

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