Please use this identifier to cite or link to this item: http://repository.yu.edu.jo:80/jspui/handle/123456789/848
Title: Morphological Characterization of Eutectic Si and Ge Phases in the Corresponding Al-15Si and Al-20Ge Alloys Using FIB Tomography
Authors: Wanderka, N
Timpel, M
Kropf, H
Subject: Hypocutectic Al-Ge Alloys;Modification of Eutectic Ge Phase
Issue Date: 2018
Publisher: عمادة البحث العلمي و الدراسات العليا
Description: المجلة الأردنية للفيزياء
2018, Vol. 11 Issue 1, Pages 5 - 15
Document Type: Article
Language: ENG
Appears in Collections:Jordan Journal of Physics - JJP

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